Utilize este identificador para referenciar este registo: http://hdl.handle.net/10400.21/2995
Título: Structural characterization of Co‐Re superlattices
Autor: Melo, L. V.
Trindade, I.
From, M.
Freitas, P. P.
Teixeira, Nuno
Silva, M. F. da
Soares, J. C.
Palavras-chave: Physics
Crystal structure
Interface structure
X-Ray diffraction
Data: Dez-1991
Editora: IEEE
Citação: Melo LV, Trindade I, From M, Freitas PP, Teixeira N, Silva MF, et al. Structural characterization of Co‐Re superlattices. J Appl Phys. 1991;70(12):7370-3.
Resumo: Co‐Re superlattices were prepared with nominal periodicities of 65–67 Å and varying bilayer composition. The structural characterization was made by x‐ray diffraction and Rutherford backscattering spectrometry (RBS). First, second, and third order satellites are observed in the x‐ray diffractogram at 2θ values and with intensities close to those predicted by simulation. This confirms the coherence of the superlattice. RBS measurements combined with RUMP simulations give information on interface sharpness and the absolute thicknesses of the Co and Re layers. Discrepancies between the experimental and simulated diffractograms are found for Co thicknesses below 18 Å.
Peer review: yes
URI: http://hdl.handle.net/10400.21/2995
ISSN: 0021-8979
Versão do Editor: http://scitation.aip.org/content/aip/journal/jap/70/12/10.1063/1.349731
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