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Structural characterization of Co‐Re superlattices

dc.contributor.authorMelo, L. V.
dc.contributor.authorTrindade, I.
dc.contributor.authorFrom, M.
dc.contributor.authorFreitas, P. P.
dc.contributor.authorTeixeira, Nuno
dc.contributor.authorSilva, M. F. da
dc.contributor.authorSoares, J. C.
dc.date.accessioned2013-12-13T15:17:26Z
dc.date.available2013-12-13T15:17:26Z
dc.date.issued1991-12
dc.description.abstractCo‐Re superlattices were prepared with nominal periodicities of 65–67 Å and varying bilayer composition. The structural characterization was made by x‐ray diffraction and Rutherford backscattering spectrometry (RBS). First, second, and third order satellites are observed in the x‐ray diffractogram at 2θ values and with intensities close to those predicted by simulation. This confirms the coherence of the superlattice. RBS measurements combined with RUMP simulations give information on interface sharpness and the absolute thicknesses of the Co and Re layers. Discrepancies between the experimental and simulated diffractograms are found for Co thicknesses below 18 Å.por
dc.identifier.citationMelo LV, Trindade I, From M, Freitas PP, Teixeira N, Silva MF, et al. Structural characterization of Co‐Re superlattices. J Appl Phys. 1991;70(12):7370-3.por
dc.identifier.issn0021-8979
dc.identifier.urihttp://hdl.handle.net/10400.21/2995
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherIEEEpor
dc.relation.publisherversionhttp://scitation.aip.org/content/aip/journal/jap/70/12/10.1063/1.349731por
dc.subjectPhysicspor
dc.subjectCobaltpor
dc.subjectCrystal structurepor
dc.subjectInterface structurepor
dc.subjectRBSpor
dc.subjectRheniumpor
dc.subjectSuperlatticespor
dc.subjectX-Ray diffractionpor
dc.titleStructural characterization of Co‐Re superlatticespor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.endPage7373por
oaire.citation.startPage7370por
oaire.citation.titleJournal of Applied Physicspor
oaire.citation.volume70por
rcaap.rightsrestrictedAccesspor
rcaap.typearticlepor

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