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In situ ellipsometry and EIS study of potentiostatic synthesis of pseudocapacitive MnOx

authorProfile.emailbiblioteca@isel.pt
datacite.subject.fosEngenharia e Tecnologia::Engenharia Mecânica
dc.contributor.authorSampaio, Rui F.V.
dc.contributor.authorMoura e Silva, Teresa
dc.contributor.authorMONTEMOR, FATIMA
dc.date.accessioned2025-09-18T12:08:30Z
dc.date.available2025-09-18T12:08:30Z
dc.date.issued2023-11-01
dc.description.abstractThis work discusses the one-step potentiostatic growth of manganese oxide on stainless steel for pseudocapacitor electrodes. The electrode material was studied through in situ ellipsometry and electrochemical impedance spectroscopy, in order to correlate its microstructure with the capacitive response. Ellipsometry results show the formation of three layers during the potentiostatic synthesis of manganese oxide on stainless steel: the thickening of the native oxide of the substrate, and the growth of two distinct layers of manganese oxide. The inner layer is slightly more compact (>n) and more resistive (<k) than the outer one. The electrochemical characterization of modified electrodes showed that the increase in the growth potential (from 0.7 to 1.0 VSCE) leads to the formation of manganese oxide films with higher specific capacitance (from 64 to 330 F g−1 at 2 A g−1). This effect is due to an increase in the area of the active material and to a decrease in the thickness of the inner layer of the manganese oxide film. However, higher growth potentials also lead to an increase in film resistivity due to the increase in the density and thickness of the outer layer, which hinders the diffusion of ions through the film as evidenced by EIS.eng
dc.identifier.citationSampaio, R. S., Silva, T. M., & Montemor, M. F. (2023). In situ ellipsometry and EIS study of potentiostatic synthesis of pseudocapacitive MnOx. Journal of the Electrochemical Society, 170(11), 1-12. https://doi.org/10.1149/1945-7111/ad05e4
dc.identifier.doihttps://doi.org/10.1149/1945-7111/ad05e4
dc.identifier.eissn1945-7111
dc.identifier.issn0013-4651
dc.identifier.urihttp://hdl.handle.net/10400.21/22144
dc.language.isoeng
dc.peerreviewedyes
dc.publisherElectrochemical Soc. Inc.
dc.relationCentro de Química Estrutural
dc.relationLA/P/0056/2020
dc.relationPTDC/QUI-ELT/2075/2020
dc.relationLISBOA-01–0247-FEDER-046109
dc.relation.hasversionhttps://iopscience.iop.org/article/10.1149/1945-7111/ad05e4
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subjectIn situ ellipsometry
dc.subjectElectrochemical impedance spectroscopy
dc.titleIn situ ellipsometry and EIS study of potentiostatic synthesis of pseudocapacitive MnOxeng
dc.typeresearch article
dspace.entity.typePublication
oaire.awardTitleCentro de Química Estrutural
oaire.awardURIinfo:eu-repo/grantAgreement/FCT/6817 - DCRRNI ID/UIDB%2F00100%2F2020/PT
oaire.citation.endPage12
oaire.citation.issue11
oaire.citation.startPage1
oaire.citation.titleJournal of The Electrochemical Society
oaire.citation.volume170
oaire.fundingStream6817 - DCRRNI ID
oaire.versionhttp://purl.org/coar/version/c_be7fb7dd8ff6fe43
person.familyNameSampaio
person.familyNameMoura e Silva
person.familyNameMONTEMOR
person.givenNameRui F.V.
person.givenNameTeresa
person.givenNameFATIMA
person.identifier2967554
person.identifier572597
person.identifier.ciencia-id1D1B-AAD5-5282
person.identifier.ciencia-id2D17-B93D-44BC
person.identifier.ciencia-id3C16-79AA-7E94
person.identifier.orcid0000-0002-4067-0389
person.identifier.orcid0000-0001-8402-6600
person.identifier.orcid0000-0001-7835-6814
person.identifier.ridF-8778-2014
person.identifier.scopus-author-id57222276656
person.identifier.scopus-author-id6506601258
person.identifier.scopus-author-id7004347821
project.funder.identifierhttp://doi.org/10.13039/501100001871
project.funder.nameFundação para a Ciência e a Tecnologia
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relation.isAuthorOfPublicationfe43fd19-4bc4-4486-a11f-534f08bc1212
relation.isAuthorOfPublication221aa2b5-1f6f-44c6-ae85-f227362e800b
relation.isAuthorOfPublication.latestForDiscovery66f9bb9b-a6e3-44e2-9be9-b435a7e3ff76
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