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A model for the refractive index of amorphous silicon for FDTD simulation of photonics waveguides

dc.contributor.authorFantoni, Alessandro
dc.contributor.authorLourenço, P.
dc.contributor.authorVieira, Manuela
dc.date.accessioned2019-04-02T10:48:21Z
dc.date.available2019-04-02T10:48:21Z
dc.date.issued2017-08-15
dc.descriptionEste trabalho foi financiado pelo Concurso Anual para Projetos de Investigação, Desenvolvimento, Inovação e Criação Artística (IDI&CA) 2016 do Instituto Politécnico de Lisboa. Código de referência IPL/2016/EXOWAVE_ISEL
dc.description.abstractThis paper presents an analysis of the material quality influence for amorphous silicon waveguides for microphotonic applications. Material quality is taken into account by a model based on the absorption coefficient data obtained by Constant Photocurrent Measurement (CPM) in the near infrared region. The GUTL (Gauss-Urbach-Tauc-Lorentz) model has been presented as an extension of the standard Urbach-Tauc-Lorentz model and proposed as a predictor for the wavelength dependent optical constants of amorphous silicon in the near infrared spectra. Values produced for the GUTL model have been used as input for a set of FDTD simulations, taking in consideration different material qualities and waveguide dimensions directed to study the characteristics of amorphous silicon waveguides embedded in a SiO2 cladding.pt_PT
dc.description.versioninfo:eu-repo/semantics/publishedVersionpt_PT
dc.identifier.citationFANTONI, Alessandro; LOURENÇO, P.; VIEIRA, Manuela – A model for the refractive index of amorphous silicon for FDTD simulation of photonics waveguides. In 17th International Conference on Numerical Simulation of Optoelectronic Devices NUSOD. Copenhagen, Denmark: IEEE, 2017. ISBN 978-1-5090-5323-0. Pp. 167-168pt_PT
dc.identifier.doi10.1109/NUSOD.2017.8010044pt_PT
dc.identifier.isbn978-1-5090-5323-0
dc.identifier.isbn978-1-5090-5324-7
dc.identifier.issn2158-3242
dc.identifier.urihttp://hdl.handle.net/10400.21/9814
dc.language.isoengpt_PT
dc.publisherInstitute of Electrical and Electronics Engineerspt_PT
dc.relationProjeto financiado no âmbito do Concurso de Projetos de Investigação, Desenvolvimento, Inovação & Criação Artística (IDI&CA) financiados pelo Instituto Politécnico de Lisboa. IPL/2016/EXOWAVE_ISELpt_PT
dc.relation.publisherversionhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8010044pt_PT
dc.subjectAmorphous siliconpt_PT
dc.subjectWaveguidespt_PT
dc.subjectConstant Photocurrent Measurement (CPM)pt_PT
dc.subjectGUTL (Gauss-Urbach-Tauc-Lorentz)pt_PT
dc.titleA model for the refractive index of amorphous silicon for FDTD simulation of photonics waveguidespt_PT
dc.typeconference object
dspace.entity.typePublication
oaire.awardURIinfo:eu-repo/grantAgreement/FCT/5876/UID%2FEEA%2F00066%2F2013/PT
oaire.citation.conferencePlace24-28 July 2017 - Copenhagen, Denmarkpt_PT
oaire.citation.endPage168pt_PT
oaire.citation.startPage167pt_PT
oaire.citation.title17th International Conference on Numerical Simulation of Optoelectronic Devices NUSODpt_PT
oaire.fundingStream5876
person.familyNameFantoni
person.familyNameVieira
person.givenNameAlessandro
person.givenNameManuela
person.identifier10792
person.identifier.ciencia-id241E-E87C-552F
person.identifier.ciencia-id9516-E25E-BB8E
person.identifier.orcid0000-0002-9938-0351
person.identifier.orcid0000-0002-1150-9895
person.identifier.ridK-1105-2016
person.identifier.ridV-7860-2017
person.identifier.scopus-author-id7006535604
person.identifier.scopus-author-id7202140173
project.funder.identifierhttp://doi.org/10.13039/501100001871
project.funder.nameFundação para a Ciência e a Tecnologia
rcaap.rightsclosedAccesspt_PT
rcaap.typeconferenceObjectpt_PT
relation.isAuthorOfPublication9f35eb1e-83e4-4342-a86d-265604301499
relation.isAuthorOfPublicationb77c6785-9cfb-4cd4-90b5-c2b816bd7d11
relation.isAuthorOfPublication.latestForDiscovery9f35eb1e-83e4-4342-a86d-265604301499
relation.isProjectOfPublication071fc4ac-15bd-4b81-9c92-2a408c74ef7b
relation.isProjectOfPublication.latestForDiscovery071fc4ac-15bd-4b81-9c92-2a408c74ef7b

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