Publication
Ion beam monitoring over a biased target
| dc.contributor.author | Lopes, J. Gabriel | |
| dc.contributor.author | Rocha, J. | |
| dc.contributor.author | Catarino, N. | |
| dc.contributor.author | Peres, M. | |
| dc.date.accessioned | 2017-11-17T10:35:19Z | |
| dc.date.available | 2017-11-17T10:35:19Z | |
| dc.date.issued | 2017-10 | |
| dc.description.abstract | A specially designed beam profile monitor (BPM) was produced to be assembled over a biased target plate, with the aim of studying the effect of an ion beam deceleration system on the beam fluence due to beam dispersion. The new BPM was developed with a shape as flat as possible, so it could be attached to a biased target plate without affecting the target geometry, using a slit scan method to produce an high-resolution beam profile. This system was designed and installed on the high current ion implanter at the Laboratorio de Aceleradores e Tecnologias de Radiacao, at the Campus Tecnologico e Nuclear, of Instituto Superior Tecnico, in Lisbon. The system is capable of showing the ion beam profile for low-energy ion beams below 15 keV, using a beam deceleration system. | pt_PT |
| dc.description.version | info:eu-repo/semantics/publishedVersion | pt_PT |
| dc.identifier.citation | LOPES, J. Gabriel [et al] - Ion Beam Monitoring Over a Biased Target. IEEE Transactions On Plasma Science. ISSN 0093-3813. Vol. 45, N.º 10, Part 1 (2017), pp. 2767-2772 | pt_PT |
| dc.identifier.doi | 10.1109/TPS.2017.2735918 | pt_PT |
| dc.identifier.issn | 0093-3813 | |
| dc.identifier.issn | 1939-9375 | |
| dc.identifier.uri | http://hdl.handle.net/10400.21/7538 | |
| dc.language.iso | eng | pt_PT |
| dc.peerreviewed | yes | pt_PT |
| dc.publisher | IEEE-Inst Electrical Electronics Engineers Inc | pt_PT |
| dc.relation | Engenharia de defeitos e funcionalização de semicondutores de largo hiato energético | |
| dc.relation.publisherversion | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=8006309 | pt_PT |
| dc.subject | Beam profile | pt_PT |
| dc.subject | High energy | pt_PT |
| dc.subject | High resolution | pt_PT |
| dc.subject | Ion beam | pt_PT |
| dc.subject | Low energy | pt_PT |
| dc.title | Ion beam monitoring over a biased target | pt_PT |
| dc.type | conference object | |
| dspace.entity.type | Publication | |
| oaire.awardTitle | Engenharia de defeitos e funcionalização de semicondutores de largo hiato energético | |
| oaire.awardURI | info:eu-repo/grantAgreement/FCT/OE/SFRH%2FBPD%2F111285%2F2015/PT | |
| oaire.citation.conferencePlace | Estoril Portugal, 18-22 de setembro2016 | pt_PT |
| oaire.citation.endPage | 2772 | pt_PT |
| oaire.citation.issue | 10 | pt_PT |
| oaire.citation.startPage | 2767 | pt_PT |
| oaire.citation.title | Joint Conference of the 6th Euro-Asian Pulsed Power Conference (EAPPC) / 21st International Conference on High-Power Particle Beams (BEAMS) / 15th International Conference on Megagauss Magnetic Field Generation and Related Topics (MEGAGAUSS) | pt_PT |
| oaire.citation.volume | 45 | pt_PT |
| oaire.fundingStream | OE | |
| project.funder.identifier | http://doi.org/10.13039/501100001871 | |
| project.funder.name | Fundação para a Ciência e a Tecnologia | |
| rcaap.rights | closedAccess | pt_PT |
| rcaap.type | conferenceObject | pt_PT |
| relation.isProjectOfPublication | e009d382-822b-4784-9e60-116cab6ca740 | |
| relation.isProjectOfPublication.latestForDiscovery | e009d382-822b-4784-9e60-116cab6ca740 |
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