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Structural and optical studies of Au doped titanium oxide films

dc.contributor.authorAlves, E.
dc.contributor.authorFranco, N.
dc.contributor.authorBarradas, N. P.
dc.contributor.authorNunes, B.
dc.contributor.authorLopes, J.
dc.contributor.authorCavaleiro, A.
dc.contributor.authorTorrell, M.
dc.contributor.authorCunha, L.
dc.contributor.authorVaz, F.
dc.date.accessioned2012-10-31T12:08:43Z
dc.date.available2012-10-31T12:08:43Z
dc.date.issued2012-02-01
dc.description.abstractThin films of TiO2 were doped with Au by ion implantation and in situ during the deposition. The films were grown by reactive magnetron sputtering and deposited in silicon and glass substrates at a temperature around 150 degrees C. The undoped films were implanted with Au fiuences in the range of 5 x 10(15) Au/cm(2)-1 x 10(17) Au/cm(2) with a energy of 150 keV. At a fluence of 5 x 10(16) Au/cm(2) the formation of Au nanoclusters in the films is observed during the implantation at room temperature. The clustering process starts to occur during the implantation where XRD estimates the presence of 3-5 nm precipitates. After annealing in a reducing atmosphere, the small precipitates coalesce into larger ones following an Ostwald ripening mechanism. In situ XRD studies reveal that Au atoms start to coalesce at 350 degrees C, reaching the precipitates dimensions larger than 40 nm at 600 degrees C. Annealing above 700 degrees C promotes drastic changes in the Au profile of in situ doped films with the formation of two Au rich regions at the interface and surface respectively. The optical properties reveal the presence of a broad band centered at 550 nm related to the plasmon resonance of gold particles visible in AFM maps. (C) 2011 Elsevier B.V. All rights reserved.por
dc.identifier.citationAlves E, Franco N, Barradas N P, Nunes B, Lopes J, Cavaleiro A, Torrell M, Cunha L, Vaz F. Structural and optical studies of Au doped titanium oxide films. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms. 2012; (272): 61-65.por
dc.identifier.issn0168-583X
dc.identifier.urihttp://hdl.handle.net/10400.21/1865
dc.language.isoengpor
dc.peerreviewedyespor
dc.publisherElsevier Science BVpor
dc.subjectIon Implantationpor
dc.subjectTiO2 Filmspor
dc.subjectAu Nanoparticlespor
dc.subjectRutherford Backscattering Spectrometrypor
dc.subjectOptical Absorptionpor
dc.subjectNanocomposite Filmspor
dc.subjectThin-Filmspor
dc.subjectNanoparticlespor
dc.subjectImplantationpor
dc.subjectSapphirepor
dc.titleStructural and optical studies of Au doped titanium oxide filmspor
dc.typejournal article
dspace.entity.typePublication
oaire.citation.conferencePlaceAmsterdampor
oaire.citation.endPage65por
oaire.citation.startPage61por
oaire.citation.titleNuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atomspor
oaire.citation.volume272por
rcaap.rightsrestrictedAccesspor
rcaap.typearticlepor

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