Repository logo
 
No Thumbnail Available
Publication

Methodology to assess medical processes based on a Failure Mode and Effects Analysis (FMEA)

Use this identifier to reference this record.
Name:Description:Size:Format: 
Methodology_JSobral_ADEM.pdf502.63 KBAdobe PDF Download

Advisor(s)

Abstract(s)

Risk is always present in every activity and several methodologies are often used to reduce or mitigate situations where risk is unacceptable. Founded on this assumption, the present paper has the objective to propose a methodology to assess critical medical processes based on a Failure Mode and Effects Analysis (FMEA), identifying and making a hierarchy of the inherent activities belonging to those processes using a quantified Risk Priority Number (RPN). Thus, based in that knowledge, it is possible to recommend actions with the purpose of lowering risk by acting on the most important failure modes. The methodology proposed will be described for medical processes and all steps to apply the methodology are sufficiently detailed for a broad comprehension in a field where such methodology is not so often applied. An intravenous medication process by infusion pump is analyzed just to demonstrate the applicability of the proposed methodology, reaching to results that are suitable to be considered and evaluated to improve a process that is widely used in hospitals and similar installations. This work brings the opportunity to experts and professional in the field to use the approach proposed for every process where safety is a priority and where undesirable situations must be avoided.

Description

Keywords

Decision support systems Accreditation Medical services Organizations Waste management Computers

Citation

SOBRAL, J.; TEIXEIRA, D.; MORAIS, H.; NEVES, M. – Methodology to assess medical processes based on a Failure Mode and Effects Analysis (FMEA). In 5th Portuguese Meeting on Bioengineering (ENBENG). Coimbra, Portugal. IEEE, 2017. ISBN 978-1-5090-4802-1. Pp. 1-4

Research Projects

Organizational Units

Journal Issue

Publisher

Institute of Electrical and Electronics Engineers

CC License

Altmetrics