Publicação
Structural and Microanalytical Studies of CrO2 Thin Films on c-Sapphire by High Resolution Electron Microscopy Methods
| dc.contributor.author | Ortiz, M. I. | |
| dc.contributor.author | Sousa, P. M. | |
| dc.contributor.author | Ballesteros, C. | |
| dc.contributor.author | Jorge Silvestre, António | |
| dc.contributor.author | Cohen, L. F. | |
| dc.contributor.author | Conde, O. | |
| dc.date.accessioned | 2012-09-12T09:29:12Z | |
| dc.date.available | 2012-09-12T09:29:12Z | |
| dc.date.issued | 2008-09 | |
| dc.description.abstract | Chromium dioxide (CrO2) has been extensively used in the magnetic recording industry. However, it is its ferromagnetic half-metallic nature that has more recently attracted much attention, primarily for the development of spintronic devices. CrO2 is the only stoichiometric binary oxide theoretically predicted to be fully spin polarized at the Fermi level. It presents a Curie temperature of ∼ 396 K, i.e. well above room temperature, and a magnetic moment of 2 mB per formula unit. However an antiferromagnetic native insulating layer of Cr2O3 is always present on the CrO2 surface which enhances the CrO2 magnetoresistance and might be used as a barrier in magnetic tunnel junctions. | por |
| dc.identifier.citation | Ortiz M I, Sousa P M, Ballesteros C, Silvestre A J, Cohen L F, Conde O. Structural and Microanalytical Studies of CrO2 Thin Films on c-Sapphire by High Resolution Electron Microscopy Methods. Microscopy and Microanalysis. ISSN: 1431-9276. 2008: 14 (3), 47-48. | por |
| dc.identifier.issn | 1431-9276 | |
| dc.identifier.uri | http://hdl.handle.net/10400.21/1779 | |
| dc.language.iso | eng | por |
| dc.peerreviewed | yes | por |
| dc.publisher | Cambridge Univ Press | por |
| dc.subject | Half-Metallic Ferromagnet | por |
| dc.title | Structural and Microanalytical Studies of CrO2 Thin Films on c-Sapphire by High Resolution Electron Microscopy Methods | por |
| dc.type | journal article | |
| dspace.entity.type | Publication | |
| oaire.citation.conferencePlace | New York | por |
| oaire.citation.endPage | 48 | por |
| oaire.citation.issue | 3 | por |
| oaire.citation.startPage | 47 | por |
| oaire.citation.title | Microscopy and Microanalysis | por |
| oaire.citation.volume | 14 | por |
| person.familyName | Silvestre | |
| person.givenName | António Jorge | |
| person.identifier.orcid | 0000-0001-6517-6275 | |
| person.identifier.scopus-author-id | 25224208600 | |
| rcaap.rights | restrictedAccess | por |
| rcaap.type | article | por |
| relation.isAuthorOfPublication | da27d795-d2eb-4f8c-bfa5-7053ef20f339 | |
| relation.isAuthorOfPublication.latestForDiscovery | da27d795-d2eb-4f8c-bfa5-7053ef20f339 |