Publication
Dissipation factor and permittivity estimation of dielectric substrates using a single microstrip line measurement
dc.contributor.author | Gonçalves, Ricardo | |
dc.contributor.author | Magueta, Roberto | |
dc.contributor.author | Pinho, Pedro | |
dc.contributor.author | Carvalho, Nuno | |
dc.date.accessioned | 2016-12-21T14:55:46Z | |
dc.date.available | 2016-12-21T14:55:46Z | |
dc.date.issued | 2016-02 | |
dc.description.abstract | The knowledge of the dielectric properties of materials, for the design of several components and circuits at high frequencies, is mandatory. In this paper, we present a simple method for the estimation of the dissipation factor (loss tangent) of dielectric materials based on the reflection measurement of a single microstrip line, which is applied to some common known materials, such as FR-4 and Rogers RO3010 laminates. The obtained results match well with the data on the literature for the considered materials. | pt_PT |
dc.description.version | info:eu-repo/semantics/publishedVersion | pt_PT |
dc.identifier.citation | GONÇALVES, Ricardo; [et al] Dissipation factor and permittivity estimation of dielectric substrates using a single microstrip line measurement. Applied Computational Electromagnetics Society Journal. ISSN: 1054-4887. Vol. 31, N.º 2 (2016), pp. 118-125 | pt_PT |
dc.identifier.issn | 1054-4887 | |
dc.identifier.uri | http://hdl.handle.net/10400.21/6647 | |
dc.language.iso | eng | pt_PT |
dc.peerreviewed | yes | pt_PT |
dc.publisher | Applied Computational Electromagnetics Society | pt_PT |
dc.relation.publisherversion | http://content.ebscohost.com/ContentServer.asp?T=P&P=AN&K=113841101&S=R&D=a9h&EbscoContent=dGJyMNXb4kSeqK84wtvhOLCmr06eprdSsKm4SLKWxWXS&ContentCustomer=dGJyMOzprkiuq7RLuePfgeyx44Dt6fIA | pt_PT |
dc.subject | Dielectric characterization | pt_PT |
dc.subject | loss factor estimation | pt_PT |
dc.subject | microwaves | pt_PT |
dc.subject | permittivity estimation | pt_PT |
dc.title | Dissipation factor and permittivity estimation of dielectric substrates using a single microstrip line measurement | pt_PT |
dc.type | journal article | |
dspace.entity.type | Publication | |
oaire.citation.endPage | 125 | pt_PT |
oaire.citation.issue | 2 | pt_PT |
oaire.citation.startPage | 118 | pt_PT |
oaire.citation.title | Applied Computational Electromagnetics Society Journal | pt_PT |
oaire.citation.volume | 31 | pt_PT |
person.familyName | Magueta | |
person.familyName | Pinho | |
person.givenName | Roberto | |
person.givenName | Pedro | |
person.identifier | 768726 | |
person.identifier.ciencia-id | D918-30F6-FFE0 | |
person.identifier.ciencia-id | 4C17-7EC8-C889 | |
person.identifier.orcid | 0000-0001-6958-4129 | |
person.identifier.orcid | 0000-0001-5588-7794 | |
person.identifier.rid | D-4304-2009 | |
person.identifier.scopus-author-id | 16031596400 | |
rcaap.rights | restrictedAccess | pt_PT |
rcaap.type | article | pt_PT |
relation.isAuthorOfPublication | 955199aa-00a9-45bd-a6e8-b231d25bf96e | |
relation.isAuthorOfPublication | 8347c340-8bc5-4fe8-8377-6bf016c2e2d2 | |
relation.isAuthorOfPublication.latestForDiscovery | 955199aa-00a9-45bd-a6e8-b231d25bf96e |